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EIA JESD 78F.02
IC Latch-Up Test
Edition
2023-11
UNE-EN 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Edition
2011-11-01
EIA JEP 193
Survey On Latch-Up Testing Practices and Recommendations for Improvements
Edition
2022-12
ABNT NBR IEC 60749-29
Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
Edition
2011-03-02
DIN EN 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011
Edition
2012-01
DIN EN 16602-20-10
Space product assurance - Off-the-shelf items utilization in space systems; English version EN 16602-20-10:2014
Edition
2014-12
DIN EN 16602-30-09
Space product assurance - Availability analysis; English version EN 16602-30-09:2014
Edition
2014-12
DIN EN 190000
Generic specification: Monolithic integrated circuits; German version EN 190000:1995
Edition
1996-05
DIN EN 190109
Family specification - Digital integrated HC MOS circuits - Series HC/HCT/HCU; German version EN 190109:1994
Edition
1996-11
DIN EN 190116
Family specification: AC MOS digital integrated circuits; German version EN 190116:1993
Edition
1995-06
