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Standards [CURRENT]

DIN EN 60749-29

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011
Edition 2012-01

Standards [CURRENT]

EIA JESD 78F.02

IC Latch-Up Test
Edition 2023-11

Standards [CURRENT]

ABNT NBR IEC 60749-29

Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
Edition 2011-03-02

Technical rule [CURRENT]

EIA JEP 193

Survey On Latch-Up Testing Practices and Recommendations for Improvements
Edition 2022-12

Standards [CURRENT]

BS EN 60749-29

Semiconductor devices. Mechanical and climatic test methods. Latch-up test
Edition 2011-08-31

Standards [CURRENT]

SN EN 60749-29

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Edition 2011-08

Standards [CURRENT]

NF C96-022-29 ; NF EN 60749-29:2012-08-01

Semiconductor devices - Mechanical and climatic test methods - Part 29: latch-up test
Edition 2012-08-01

Standards [CURRENT]

UNE-EN 60749-29

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Edition 2011-11-01

Standards [CURRENT]

OEVE/OENORM EN 60749-29

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011) (german version)
Edition 2012-03-01

Standards [CURRENT]

EIA JESD 94B

Application Specific Qualification Using Knowledge Based Test Methodology
Edition 2015-10

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