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NA 152

DIN Standards Committee Technical Fundamentals

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Technical rule [CURRENT]

VDI/VDE 2655 Blatt 1.1
Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement

Title (German)

Optische Messtechnik an Mikrotopografien - Kalibrieren von Interferenzmikroskopen und Tiefeneinstellnormalen für die Rauheitsmessung

Edition 2024-01
Original language German , English
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