NA 176
DIN Standards Committee Health Technologies
DIN EN ISO 11608-4 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60529 | 1989-11 | Degrees of protection provided by enclosures (IP code) More |
| IEC 60747-5-5 | 2020-07 | Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers More |
| IEC 61000-3-2 | 2018-01 | Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase) More |
| IEC 61000-3-3 | 2013-05 | Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection More |
| IEC 61000-4-11 | 2020-01 | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase More |
| IEC 61000-4-3 | 2020-09 | Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency electromagnetic field immunity test More |
| IEC 61000-4-39 | 2017-03 | Electromagnetic compatibility (EMC) - Part 4-39: Testing and measurement techniques - Radiated fields in close proximity - Immunity test More |
| IEC 61000-4-4 | 2012-04 | Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test More |
| IEC 61000-4-5 | 2014-05 | Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test More |
| IEC 61000-4-6 | 2013-10 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields More |
