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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [Withdrawn]

DIN EN 60749-30
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005); German version EN 60749-30:2005

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 30: Behandlung nicht hermetisch verkappter oberflächenmontierbarer Bauelemente vor Zuverlässigkeitsprüfungen (IEC 60749-30:2005); Deutsche Fassung EN 60749-30:2005

Document: references other documents

Document: referenced in other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Responsible international committee

IEC/TC 47 - Semiconductor devices  

Edition 2005-06
Original language German
Price from 82.60 €
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