NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-2-103 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60512-25-3 | 2001-07 | Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c; Rise time degradation More |
| IEC 60512-25-4 | 2001-07 | Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d; Propagation delay More |
| IEC 60512-25-5 | 2004-07 | Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss More |
| IEC 60512-25-6 | 2004-05 | Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter More |
| IEC 60512-25-7 | 2004-12 | Connectors for electronic equipment - Tests and measurements - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR) More |
| IEC 60512-2-6 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 2-6: Electrical continuity and contact resistance tests; Test 2f: Housing (shell) electrical continuity More |
| IEC 60512-3 | 1976 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 3 : Current-carrying capacity tests More |
| IEC 60512-3-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests; Test 3a: Insulation resistance More |
| IEC 60512-4 | 1976 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 4 : Dynamic stress tests More |
| IEC 60512-4-1 | 2003-05 | Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests; Test 4a: Voltage proof More |
