2. Getting involved
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  4. DKE
NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

DIN EN 60747-15 [Withdrawn] references following documents:

Document number Edition Title
IEC 60749-19 2003-02 Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test More 
IEC 60749-2 2002-04 Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure More 
IEC 60749-25 2003-07 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling More 
IEC 60749-36 2003-02 Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state More 
IEC/TR 61340-2-2 2000-07 Electrostatics - Part 2-2: Measurement methods; Measurement of chargeability More