2. Getting involved
  3. Standards Committees
  4. DKE
NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

DIN EN 60749-20 [Withdrawn] references following documents:

Document number Edition Title
EN 60749-3 2002-08 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2002) More 
IEC 60068-2-20 1979 Environmental testing. Part 2: Tests. Test T: Soldering More 
IEC 60749-3 2002-04 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination More