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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 60747-15 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60068-2-1 | 2007-03 | Environmental testing - Part 2-1: Tests - Test A: Cold More |
| IEC 60664-1 | 2020-05 | Insulation coordination for equipment within low-voltage supply systems - Part 1: Principles, requirements and tests More |
| IEC 60721-3-3 | 2019-05 | Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations More |
| IEC 60747-1 | 2006-02 | Semiconductor devices - Part 1: General More |
| IEC 60747-2 | 2016-04 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes More |
| IEC 60747-6 | 2016-04 | Semiconductor devices - Part 6: Discrete devices - Thyristors More |
| IEC 60747-9 | 2019-11 | Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs) More |
| IEC 60749-12 | 2017-12 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency More |
| IEC 60749-15 | 2020-07 | Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices More |
| IEC 60749-21 | 2011-04 | Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability More |
