DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 61000-4-20
; VDE 0847-4-20:2025-03
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2022); German version EN IEC 61000-4-20:2022
Elektromagnetische Verträglichkeit (EMV) - Teil 4-20: Prüf- und Messverfahren - Messung der Störaussendung und Prüfung der Störfestigkeit in transversal-elektromagnetischen (TEM-)Wellenleitern (IEC 61000-4-20:2022); Deutsche Fassung EN IEC 61000-4-20:2022
Overview
This document describes methods for the measurement of high frequency electromagnetic emissions of electrical and electronical equipment and for the test of the immunity of the equipment in relation to high frequency electromagnetic fields using various types of transverse electromagnetic (TEM) waveguides. The measurement of interference emissions is specified in normative Annex A and the testing of immunity is specified in normative Annex B. Tests with HEMP transients are described in normative Annex C. The waveguides considered in this standard include open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. Information used to characterize waveguides is provided in Annex D. The usable frequency range depends on the specific testing requirements and the specific TEM waveguide type. Equipment to be tested in the TEM waveguide shall be small and shall not have any cables connected to them. The standard differs from DIN EN 61000-4-20 (VDE 0847-4-20):2011-07 and DIN EN 61000-4-20 Corrigendum 1 (VDE 0847-4-20 Corrigendum 1):2012-09 as follows: a) information is included on the testing of large EUTs (including cables); b) implementation of work on measurement uncertainties by adopting the completed work of CISPR and TC 77 (on emissions and immunity); c) updating of the procedure for proving the suitability of the test volume with regard to field homogeneity and verification of TEM mode; d) provision of information on two-port and four-port TEM waveguides; e) addition of a new informative annex (Annex I) on the characterization of TEM waveguides with transients; and f) addition of information on dielectric test benches.
