DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 63215-2
Endurance test methods for die attach materials - Part 2: Temperature cycling test method for die attach materials applied to discrete type power electronic devices (IEC 63215-2:2023); German version EN IEC 63215-2:2023
Verfahren für die Haltbarkeitsprüfung von Werkstoffen zum Chip-Bonden - Teil 2: Verfahren für die Temperaturwechselprüfung von Werkstoffen zum Chip-Bonden von leistungseektronischen Bauelementen (IEC 63215-2:2023); Deutsche Fassung EN IEC 63215-2:2023
Overview
This part of IEC 63215 applies to the die attach materials and joining system applied to discrete type power electronic devices. This document specifies the temperature cycling test method which takes into account the actual usage conditions of discrete type power electronic devices to evaluate reliability of the die attach joint materials and joining system, and establishes a classification level for joining reliability (reliability performance index). The test method specified in this document is not intended to evaluate power semiconductor devices themselves. The test method specified in this document is not regarded as the one for use to guarantee the reliability of the power semiconductor device packages. Through its application, the document increases investment security for manufacturers and users, provides testing laboratories and manufacturers with defined information for testing.
Responsible national committee
DKE/K 682 - Aufbau- und Verbindungstechnik für elektronische Baugruppen
