NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62239-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| GEIA-STD-0002-1 | 2005-08 | Aerospace Qualified Electronic Component (AQEC) Requirements, Volume 1 - Integrated Circuits and Semiconductors More |
| IEC 60068-2-58 | 2015-03 | Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) More |
| IEC 60695-11-5 | 2016-12 | Fire hazard testing - Part 11-5: Test flames - Needle-flame test method - Apparatus, confirmatory test arrangement and guidance More |
| IEC 61193-2 | 2007-08 | Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages More |
| IEC 61760-4 | 2015-05 | Surface mounting technology - Part 4: Classification, packaging, labelling and handling of moisture sensitive devices More |
| IEC 61967-1 | 2018-12 | Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions More |
| IEC 61967-2 | 2005-09 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method More |
| IEC 61967-6 | 2002-06 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method More |
| IEC 61967-6 AMD 1 | 2008-03 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method; Amendment 1 More |
| IEC 61967-6 Corrigendum 1 | 2010-08 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method More |
