NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 165000-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60068-2-7 AMD 1 | 1986 | Basic environmental testing procedures. Part 2 : Tests. Test Ga and guidance: Acceleration, steady state More |
| IEC 60134 | 1961 | System of limiting values of electronic tubes and valves and the adequate semiconductor devices More |
| IEC 60695-2-2 | 1991-04 | Fire hazard testing; part 2: test method; section 2: needle-flame test More |
| IEC 60747-1 | 1983 | Semiconductor devices. Discrete devices. Part 1 : General More |
| IEC 60747-1 AMD 2 | 1993-10 | Semiconductor devices; discrete devices and integrated circuits; part 1: general; amendment 2 More |
| IEC 60748-1 | 1984 | Semiconductor devices. Integrated circuits.. Part 1 : General More |
| IEC 60749 | 1984 | Semiconductor devices. Mechanical and climatic test methods More |
| IEC 60749 AMD 1 | 1991-11 | Semiconductor devices; mechanical and climatic test methods; amendment 1 More |
| IEC 60749 AMD 2 | 1993-09 | Semiconductor devices; mechanical and climatic test methods; amendment 2 More |
