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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 61000-4-5 ; VDE 0847-4-5:1996-09 [Withdrawn] references following documents:

Document number Edition Title
IEC 61000-4-11 1994-06 Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests More 
IEC 61000-4-12 1995-05 Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 12: Oscillatory waves immunity test; basic EMC publication More 
IEC 61000-4-2 1995-01 Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 2: Electrostatic discharge immunity test - Basic EMC publication More 
IEC 61000-4-3 1995-02 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 3: Radiated, radio-frequency, electromagnetic field immunity test More 
IEC 61000-4-4 1995-01 Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 4: Electrical fast transient/burst immunity test - Basic EMC publication More 
IEC 61000-4-5 1995-02 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 5: Surge immunity test More 
IEC 61000-4-6 1996-03 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 6: Immunity to conducted disturbances, induced by radio-frequency fields More 
IEC 61000-4-7 1991-07 Electromagnetic compatibility (EMC); part 4: testing and measuring techniques; section 7: general guide on harmonics and interharmonics measurements and instrumentation, for power suplly systems and equipment connected thereto More 
IEC 61000-4-8 1993-06 Electromagnetic compatibility (EMC); part 4: testing and measurement techniques; section 8: power frequency magnetic field immunity test; basic EMC publication More 
IEC 61000-4-9 1993-06 Electromagnetic compatibility (EMC); part 4: testing and measurement techniques; section 9: pulse magnetic field immunity test; basic EMC publication More