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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60749-44 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-38 | 2008-02 | Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory More |
| IEC 62396-4 | 2013-09 | Process management for avionics - Atmospheric radiatio effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects More |
| IEC 62396-5 | 2014-08 | Process management for avioncs - Atmospheric radioation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems More |
