NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62747 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60747-5-3 | 1997-08 | Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods More |
| IEC 60747-6-3 ; QC 750113:1993-11 | 1993-11 | Semiconductor devices; discrete devices; part 6: thyristors: section 3: blank detail specification for reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A More |
| IEC 60747-7 | 2010-12 | Semiconductor devices - Discrete devices - Part 7: Bipolar transistors More |
| IEC 60747-8 | 2010-12 | Semiconductor devices - Discrete devices - Part 8: Field-effect transistors More |
| IEC 60747-8-2 ; QC 750106:1993-02 | 1993-02 | Semicoductor devices; discrete devices; part 8: field-effect transistors; section 2: blank detail specification for field-effect transistors for case-rated power amplifier applications More |
| IEC 60747-8-3 ; QC 750114:1995-04 | 1995-04 | Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field-effect transistors for switching applications More |
| IEC 62751-1 | 2014-08 | Determination of power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 1: General requirements More |
| IEC 62751-2 | 2014-08 | Determination of power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 2: Modular multilevel converters More |
