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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

DIN EN 60749-21 [CURRENT] references following documents:

Document number Edition Title
IEC 60749-40 2011-07 Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge More 
IEC 60749-7 2011-06 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases More 
IEC 60749-8 2002-08 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing More 
IEC 60749-8 Corrigendum 1 2003-04 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing More 
IEC 60749-8 Corrigendum 2 2003-08 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing More