NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors
Abstract
This part of IEC 60747-14-X specifies the terms, definitions, configurations and test methods that can be used to evaluate and determine the performance characteristics of spectral sensors.
Begin
2026-04-10
Planned document number
DIN EN IEC 60747-14-13
Project number
02233792
