NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Standard test procedures for semiconductor X-ray energy spectrometers
Abstract
This document describes standard test procedures for semiconductor X-ray energy spectrometers which consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.
Begin
2025-09-16
Planned document number
DIN IEC 60759
Project number
02233398
Responsible national committee
DKE/K 967 - Mess-, Steuer- und Regelungstechnik im Zusammenhang mit ionisierender Strahlung
