• Hydrogen Technologies Standards form the basic framework for market ramp-up

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  • Climate change Standards and specifications support climate targets

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  • Smart Farming Standards and specifications are drivers for the digitalization of agriculture

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Projects of DKE/K 631

DIN EN IEC 63492-1 2023-04-21 Semiconductor devices - Isolation for semiconductor devices - Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices More  Comment 
DIN EN IEC 63287-3 2022-11-25 Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module More  Comment 
DIN EN IEC 60749-5 2022-09-15 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022); German and English version prEN IEC 60749-5:2022 More  Comment 
DIN EN IEC 62228-5-100 2022-06-29 Amendment 1 -Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers More  Comment 
DIN EN IEC 60749-34-1 2022-05-03 Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module More  Comment 
DIN IEC 63150-3 2022-05-03 Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 3: Human foot impact motion More  Comment 
DIN EN IEC 61967-8 2022-05-03 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (IEC 47A/1136/CD:2022); Text in German and English More  Comment 
DIN EN IEC 63364-1 2022-03-22 Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021); German and English version prEN IEC 63364-1:2021 More  Comment 
DIN EN IEC 60749-28 2022-03-22 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022 More  Comment 
DIN EN IEC 63287-2 2021-06-25 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021); German and English version prEN IEC 63287-2:2021 More  Comment 

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