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Draft standard [Pre-order]

DIN EN IEC 63616 ; VDE 0887-969-73:2026-07
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method (IEC 63616:2025); German version EN IEC 63616:2026

Title (German)

Messung der Leitfähigkeit von Metalldünnschichten bei Mikrowellen- und Millimeterwellenfrequenzen nach dem symmetrischen Kreisscheibenresonatorverfahren (IEC 63616:2025); Deutsche Fassung EN IEC 63616:2026

Responsible national committee

DKE/UK 412.4 - Passive HF- und Mikrowellenbauelemente  

Edition 2026-07
Publication 2026-06-26
Public enquiry period 2026-06-26
until
2026-08-26
Original language German
Price from 20.08 €
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