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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Draft standard [Withdrawn]

DIN IEC 47(CO)1089
Semiconductor devices; measuring method for emission source length and width and astigmatism of a laser diode without pigtail; identical with IEC 47(Central Office)1089

Title (German)

Halbleiterbauelemente; Meßverfahren für die Bestimmung der Größe der Emissions-Austrittsfläche und des Astigmatismus von Laser-Dioden ohne Faseranschluß; Identisch mit IEC 47(CO)1089

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Edition 1991-05

Original language German

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN IEC 47(CO)1089 Semiconductor devices; measuring method for emission source length and width and astigmatism of a laser diode without pigtail; identical with IEC 47(Central Office)1089

Responsible national committee

Tim Brückmann

DIN IEC 47(CO)1089
Semiconductor devices; measuring method for emission source length and width and astigmatism of a laser diode without pigtail; identical with IEC 47(Central Office)1089