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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Draft standard [Withdrawn]

DIN IEC 47(CO)1081
Semiconductor devices; measuring method for small-signal cut-off frequency of a photodiode; identical with IEC 47(Central Office)1081

Title (German)

Halbleiterbauelemente; Meßverfahren für die Kleinsignal-Grenzfrequenz von Photodioden; Identisch mit IEC 47(CO)1081

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Edition 1991-05

Original language German

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN IEC 47(CO)1081 Semiconductor devices; measuring method for small-signal cut-off frequency of a photodiode; identical with IEC 47(Central Office)1081

Responsible national committee

Tim Brückmann

DIN IEC 47(CO)1081
Semiconductor devices; measuring method for small-signal cut-off frequency of a photodiode; identical with IEC 47(Central Office)1081