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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Draft standard [Withdrawn]

DIN IEC 47(CO)1162
Semiconductor devices; excess noise factor of an APD with/without pigtail; measuring method; identical with IEC 47(Central Office)1162

Title (German)

Halbleiterbauelemente; Multiplikationsrauschen bei APD mit/ohne Faseranschluß; Meßverfahren; Identisch mit IEC 47(CO)1162

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Edition 1990-06

Original language German

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Table of contents

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN IEC 47(CO)1162 Semiconductor devices; excess noise factor of an APD with/without pigtail; measuring method; identical with IEC 47(Central Office)1162

Responsible national committee

Tim Brückmann

DIN IEC 47(CO)1162
Semiconductor devices; excess noise factor of an APD with/without pigtail; measuring method; identical with IEC 47(Central Office)1162