Attention: Your browser doesn't support javascript or you have deactivated Javascript in your browser. Please enable Javascript in your browser in order to be able to use all functions of this website.

NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Draft standard [Withdrawn]

DIN IEC 47(CO)1082
Semiconductor devices; measuring method for radiant power or forward current of LEDs, IREDs and laser diodes; identical with IEC 47(Central Office)1082

Title (German)

Halbleiterbauelemente; Meßverfahren für Strahlungsleistung oder Vorwärtsstrom von LEDs, IREDs und Laser-Dioden; Identisch mit IEC 47(CO)1082

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Edition 1989-01

Original language German

Price from 35.60 €

Order from DIN Media

Contact

Dr.

Tim Brückmann

Merianstr. 28
63069 Offenbach am Main

Tel.: +49 69 6308-364

Send message to contact

Economic benefits

DIN SPEC

Why do standards cost money?

Get involved in standardization

Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN IEC 47(CO)1082 Semiconductor devices; measuring method for radiant power or forward current of LEDs, IREDs and laser diodes; identical with IEC 47(Central Office)1082

Responsible national committee

Tim Brückmann

DIN IEC 47(CO)1082
Semiconductor devices; measuring method for radiant power or forward current of LEDs, IREDs and laser diodes; identical with IEC 47(Central Office)1082