Projekt
Complete update of IEC 60749. Addition of test methods (together with proposed number): IEC 60749-20-1, IEC 60749-35, IEC 60749-37, IEC 60749-38, IEC 60749-39
Beginn
2004-01-16
Geplante Dokumentnummer
IEC 47/1744/NP
Zuständiges nationales Arbeitsgremium
DKE/K 631 - Halbleiterbauelemente
