Project
Amendment 3 to IEC 60747-7, Ed. 1: Bipolar transistors
Abstract
This draft deals with additional measuring methods for bipolar transistors to be introducted in IEC 60747-7.
Begin
1996-02-09
Planned document number
IEC 47E/150/FDIS
Responsible national committee
DKE/UK 631.1 - Einzel-Halbleiterbauelemente
