Abstract

This document describes standard test procedures for semiconductor X-ray energy spectrometers which consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

Begin

2025-09-16

Planned document number

DIN IEC 60759

Project number

02233398

Responsible national committee

DKE/K 967 - Mess-, Steuer- und Regelungstechnik im Zusammenhang mit ionisierender Strahlung