Project
Photovoltaic modules - Bypass diode - Thermal runaway test
Abstract
This document provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.
Begin
2025-07-31
Planned document number
DIN EN IEC 62979
Project number
02233327
