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Project

ISO/AWI TS 22292

Nanotechnologies - 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

Project

ISO/AWI 32543-5

Non-destructive testing - Characteristics of focal spots in industrial X-ray systems - Part 5: Focal spot reconstruction technique

Project

prEN ISO 32543-5

Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Focal spot reconstruction technique

Project

DIN EN ISO 32543-5

Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Focal spot reconstruction technique

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