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DIN EN IEC 60749-23
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2881/CDV:2024); German and English version prEN IEC 60749-23:2024
NA 005-07-01-11 AK -dormant
Durability
ISO/TC 136/WG 3
Storage units - Test methods for determination of strength and durability
ISO/TC 28/JWG 23
Field performance equipment for rolling bearing grease life
ISO/TC 59/SC 14
Service life planning
CEN/TC 155/WG 28
Test methods for assessment of lifetime of non- pressure thermoplastic piping systems
ISO/TC 67/SC 2/WG 17
Pipeline life extension
ISO/TC 156/SC 1
Corrosion control engineering life cycle
ISO/TC 4/SC 8
Load ratings and life
NA 118-01-08 AA
Load ratings and rating life
