Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 2: Determination of Oxygen impurities in Nitrogen, Argon, Helium, Neon and Hydrogen using a galvanic cell

Design and manufacture of site built, vertical, cylindrical, flat-bottomed tank systems for the storage of refrigerated, liquefied gases with operating temperatures between 0 °C and -196 °C - Part 6: Specification for the design and construction of single containment tanks for the storage of liquid oxygen, liquid nitrogen or liquid argon