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DIN EN IEC 60749-34-1
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 60749-34-1:2025); German version EN IEC 60749-34-1:2025
DIN EN IEC 60793-1-20
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
DIN EN IEC 60793-1-21
Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry
DIN EN IEC 60793-1-47
Optical fibres - Part 1-47: Measurement methods and test procedures - Macrobending loss
DIN EN IEC 60793-1-49
Optical fibres - Part 1-49: Measurement methods and test procedures - Differential mode delay
DIN EN IEC 60793-1-50
Optical fibres - Part 1-50: Measurement methods and test procedures - Damp heat (steady state) tests
DIN EN IEC 60793-1-51
Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat (steady state) tests
DIN EN IEC 60793-1-52
Optical fibres - Part 1-52: Measurement methods and test procedures - Change of temperature tests
DIN EN IEC 60793-1-53
Optical fibres - Part 1-53: Measurement methods and test procedures - Water immersion tests
DIN EN IEC 60793-1-61
Optical fibres - Part 1-61: Measurement methods and test procedures - Polarization crosstalk
