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DIN EN IEC 60749-24
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 47/2863/CDV:2024); German and English version prEN IEC 60749-24:2024
DIN EN IEC 60749-26
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 47/2882/CDV:2024); German and English version prEN IEC 60749-26:2024
DIN EN IEC 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
DIN EN IEC 60749-34-1
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 47/2759/CD:2022); Text in German and English
DIN EN IEC 60793-1-20
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
DIN EN IEC 60793-1-47
Optical fibres - Part 1-47: Measurement methods and test procedures - Macrobending loss
DIN EN IEC 60793-1-49
Optical fibres - Part 1-49: Measurement methods and test procedures - Differential mode delay
DIN EN IEC 60793-1-50
Optical fibres - Part 1-50: Measurement methods and test procedures - Damp heat (steady state) tests
DIN EN IEC 60793-1-51
Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat (steady state) tests
DIN EN IEC 60793-1-52
Optical fibres - Part 1-52: Measurement methods and test procedures - Change of temperature tests
