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EIA JESD 57
Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation
Edition
1996-12
BS IEC 62396-2
Process management for avionics. Atmospheric radiation effects. Guidelines for single event effects testing for avionics systems
Edition
2018-01-11
PD IEC/TR 62396-7
Process management for avionics. Atmospheric radiation effects. Management of single event effects (SEE) analysis process in avionics design
Edition
2017-09-30
BS IEC 62396-4
Process management for avionics. Atmospheric radiation effects. Design of high voltage aircraft electronics managing potential single event effects
Edition
2013-10-31
OEVE/OENORM EN 62396-1
Process management for avionics - Atmospheric radiation effects - Part 1: Accomodation of atmospheric radiation effects via single event effects within avionics electronic equipment (IEC 107/153/CDV)
Edition
2011-06-01
BS IEC 62396-3
Process management for avionics. Atmospheric radiation effects. System design optimization to accommodate the single event effects (SEE) of atmospheric radiation
Edition
2013-10-31
BS IEC 62396-5
Process management for avionics. Atmospheric radiation effects. Assessment of thermal neutron fluxes and single event effects in avionics systems
Edition
2014-08-31
BS EN 62396-1
Process management for avionics. Atmospheric radiation effects. Accommodation of atmospheric radiation effects via single event effects within avionics electronic
Edition
2016-01-31
PD IEC/TR 62396-8
Process management for avionics. Atmospheric radiation effects. Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment. Awareness guidelines
Edition
2020-05-12
UNE-EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
Edition
2016-12-01