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Standards [CURRENT]

EIA JESD 57

Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation
Edition 1996-12

Standards [CURRENT]

BS IEC 62396-2

Process management for avionics. Atmospheric radiation effects. Guidelines for single event effects testing for avionics systems
Edition 2018-01-11

Standards [CURRENT]

PD IEC/TR 62396-7

Process management for avionics. Atmospheric radiation effects. Management of single event effects (SEE) analysis process in avionics design
Edition 2017-09-30

Standards [CURRENT]

BS IEC 62396-4

Process management for avionics. Atmospheric radiation effects. Design of high voltage aircraft electronics managing potential single event effects
Edition 2013-10-31

Process management for avionics - Atmospheric radiation effects - Part 1: Accomodation of atmospheric radiation effects via single event effects within avionics electronic equipment (IEC 107/153/CDV)
Edition 2011-06-01

Standards [CURRENT]

BS IEC 62396-3

Process management for avionics. Atmospheric radiation effects. System design optimization to accommodate the single event effects (SEE) of atmospheric radiation
Edition 2013-10-31

Standards [CURRENT]

BS IEC 62396-5

Process management for avionics. Atmospheric radiation effects. Assessment of thermal neutron fluxes and single event effects in avionics systems
Edition 2014-08-31

Standards [CURRENT]

BS EN 62396-1

Process management for avionics. Atmospheric radiation effects. Accommodation of atmospheric radiation effects via single event effects within avionics electronic
Edition 2016-01-31

Standards [CURRENT]

PD IEC/TR 62396-8

Process management for avionics. Atmospheric radiation effects. Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment. Awareness guidelines
Edition 2020-05-12

Standards [CURRENT]

UNE-EN 60749-44

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
Edition 2016-12-01

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