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VDI/VDE 2656 Blatt 1
Determination of geometrical quantities by using of scanning probe microscopes - Calibration of measurement systems
Edition
2019-09
DIN 32567-1
Production equipment for microsystems - Determination of the influence of materials on the optical and tactile dimensional metrology - Part 1: Qualitative estimation of the material and procedure specific influences
Edition
2015-06
DIN EN 62047-1
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2016); German version EN 62047-1:2016
Edition
2016-12
DIN EN 62047-11
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems (IEC 62047-11:2013); German version EN 62047-11:2013
Edition
2014-04
DIN EN 62047-4
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 62047-4:2008); German version EN 62047-4:2010
Edition
2011-03
DIN EN 62047-25
Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area (IEC 62047-25:2016); German version EN 62047-25:2016
Edition
2017-04
DIN 58557-1
Production equipment for microsystems - Method for measuring the shape of microlens arrays - Part 1: Single sided measurement of a microlens array
Edition
2023-03
DIN 32567-3
Production equipment for microsystems - Determination of the influence of materials on the optical and tactile dimensional metrology - Part 3: Derivation of correction values for tactile measuring devices
Edition
2025-05
DIN EN ISO 14644-9
Cleanrooms and associated controlled environments - Part 9: Assessment of surface cleanliness for particle concentration (ISO 14644-9:2022); German version EN ISO 14644-9:2022
Edition
2022-10
DIN ISO 18457
Biomimetics - Biomimetic materials, structures and components (ISO 18457:2016)
Edition
2018-06