Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
Edition 2017-04

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
Edition 2008-10

Broadcast digital video tape recorders - Identification method for recording and/or reproduction error status (IEC 62070:2001); German version EN 62070:2001
Edition 2001-11

Plastics moulded parts - Surface qualities; Text in German and English
Edition 2023-12

Consumer audio/video equipment digital interface with plastic optical fibre (IEC 62300:2004); German version EN 62300:2005
Edition 2005-06

Audio archive system - Part 1-2: BD disk and data migration for long-term audio data storage (IEC 62702-1-2:2017)
Edition 2018-06

Quantities and units - Part 13: Information science and technology (IEC 80000-13:2008); German version EN 80000-13:2008
Edition 2009-01

Industrial communication networks - Profiles - Part 3-17: Functional safety fieldbuses - Additional specifications for CPF 17 (IEC 61784-3-17:2016); English version EN 61784-3-17:2017
Edition 2018-09

Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (IEC 61290-4-1:2016); German version EN 61290-4-1:2016
Edition 2017-06

Fibre optic communication subsystem test procedures - Part 2-10: Digital systems - Time-resolved chirp and alpha-factor measurement of laser transmitters (IEC 61280-2-10:2005); German version EN 61280-2-10:2005
Edition 2006-03