Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
Edition 2008-10

Information Technology - Coding of Audio-Visual Objects - Part 2: Visual - Amendment 1: Error Resilient Simple Scalable Profile (Adopted Amendment 1:2004 to ISO/IEC 14496-2:2004)
Edition 2005

Information Technology - Coding of Audio-Visual Objects - Part 4: Conformance Testing - Amendment 5: Conformance Extensions for Error-Resilient Simple Scalable Profile (Adopted Amendment 5:2005 to ISO/IEC 14496-4:2004)
Edition 2006-12-01

Information Technology - Coding of Audio-Visual Objects - Part 5: Reference Software - Amendment 5: Reference Software Extensions for Error Resilient Simple Scalable Profile (Adopted Amendment 5:2004 to ISO/IEC 14496-5:2001)
Edition 2006-12-01

Information technology - High efficiency coding and media delivery in heterogeneous environments - Part 10: MPEG Media Transport Forward Error Correction (FEC) codes (Adopted ISO/IEC 23008-10:2015, first edition, 2015-04-15)
Edition 2016-12-01

Information technology - High efficiency coding and media delivery in heterogeneous environments - Part 10: MPEG Media Transport Forward Error Correction (FEC) codes
Edition 2015-04

Information technology - High efficiency coding and media delivery in heterogeneous environments - Part 10: MPEG media transport forward error correction (FEC) codes - Amendment 1: Window-based FEC code
Edition 2021-12

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008)
Edition 2008-12-01

Semiconductor devices - Mechanical and climatic test methods - Part 38: soft error test method for semiconductor devices with memory
Edition 2008-06-01

BS EN 2591-229. Aerospace series. Elements of electrical and optical connection. Test methods. Part 229. Bit Error Rate
Edition 2016-11-24