Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022
Edition 2024-05

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017); German version EN 60749-28:2017
Edition 2018-02

Alarm and electronic security systems - Part 11-5: Electronic access control systems - Open Supervised Device Protocol (OSDP) (IEC 60839-11-5:2020); German version EN IEC 60839-11-5:2020
Edition 2021-11

Field device tool (FDT) interface specification - Part 1: Overview and guidance (IEC 65E/803/CD:2021); Text in English
Edition 2022-08

Field Device Tool (FDT) interface specification - Part 1: Overview and guidance (IEC 62453-1:2016); German version EN 62453-1:2017
Edition 2017-11

Field device tool (FDT) interface specification - Part 2: Concepts and detailed description (IEC 62453-2:2022); English version EN IEC 62453-2:2022
Edition 2024-01

Field device tool (FDT)-interface specification - Part 71: OPC UA Information Model for FDT (IEC 65E/766/CD:2020); Text in English
Edition 2022-03

Field device tool (FDT) interface specification - Part 301: Communication profile integration - IEC 61784 CPF 1 (IEC 62453-301:2009); English version EN 62453-301:2009
Edition 2010-02

Field device tool (FDT) interface specification - Part 301: Communication profile integration - IEC 61784 CPF 1 (IEC 62453-301:2009/A1:2016); English version EN 62453-301:2009/A1:2017
Edition 2018-07

Field device tool (FDT) interface specification - Part 302: Communication profile integration - IEC 61784 CPF 2 (IEC 65E/791/CDV:2021); English version prEN IEC 62453-302:2021
Edition 2022-08