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Standards [CURRENT]

DIN 50162

Testing of clad steels; determination of shear strength between cladding metal and parent metal in shear test
Edition 1978-09

Standards [CURRENT]

DIN 50280

Running Test on Radial Plain Bearings; General
Edition 1975-10

Standards [CURRENT]

DIN 50282

Plain bearings - Tribological behaviour of metallic antifriction materials - Significant terms
Edition 2019-06

Draft standard

DIN 50450-2

Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 2: Determination of Oxygen impurities in Nitrogen, Argon, Helium, Neon and Hydrogen using a galvanic cell
Edition 2025-07

Standards [CURRENT]

DIN 50450-2

Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N₂, Ar, He, Ne and H₂ by using a galvanic cell
Edition 1991-03

Standards [CURRENT]

DIN 50450-9

Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonoxide, carbondioxide, hydrogen and C₁-C₃-hydrocarbons in gaseous hydrogen chloride by gaschromatography
Edition 2021-07

Standards [CURRENT]

DIN 50451-3

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS
Edition 2014-11

Standards [CURRENT]

DIN 50451-4

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
Edition 2024-09

Standards [CURRENT]

DIN 50451-5

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5: Guideline for the selection of materials and testing of their suitability for apparatus for sampling and sample preparation for the determination of trace elements in the range of micrograms per kilogram and nanograms per kilogram
Edition 2022-08

Standards [CURRENT]

DIN 50451-6

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH₄F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid
Edition 2014-11

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