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NF C80-114 ; NF EN 100114-1:1996-12-01
Rule of procedure. Quality assessment procedures. Part 1: CECC requirements for the approval of an organization
Edition
1996-12-01
NF C80-201 ; NF EN 62415:2010-11-01
Semiconductor devices - Constant current electromigration test
Edition
2010-11-01
NF C80-202 ; NF EN 62416:2010-11-01
Semiconductor devices - Hot carrier test on MOS transistors
Edition
2010-11-01
NF C80-203 ; NF EN 62417:2010-11-01
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Edition
2010-11-01
NF C80-204 ; NF EN 62418:2011-03-01
Semiconductor devices - Metallization stress void test
Edition
2011-03-01
UTE C80-804U ; UTE C80-804:1995-03-01
Electronic components. Guidance document. Interpretation of "EN 29000". Reliability aspects for electronic components. (specification CECC 00 804)
Edition
1995-03-01
FD C80-811
Reliability Methodology for Electronic Systems
Edition
2025-04-09
NF C82-103-1 ; NF EN 61926-1:2002-10-01
Design automation - Part 1: standard test language for all systems - Common abbreviated test language for all systems (C/ATLAS)
Edition
2002-10-01
NF C82-242 ; NF EN 140402:2018-04-14
Blank detail specification : fixed low power wirewound surface mount (SMD) resistors
Edition
2018-04-14
NF C82-242/A1 ; NF EN 140402/A1:2018-04-14
Blank detail specification : fixed low power wirewound surface mount (SMD) resistors
Edition
2018-04-14
