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Standards [CURRENT]

NF C80-202 ; NF EN 62416:2010-11-01

Semiconductor devices - Hot carrier test on MOS transistors
Edition 2010-11-01

Standards [CURRENT]

NF C80-203 ; NF EN 62417:2010-11-01

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Edition 2010-11-01

Standards [CURRENT]

NF C80-204 ; NF EN 62418:2011-03-01

Semiconductor devices - Metallization stress void test
Edition 2011-03-01

Standards [CURRENT]

UTE C80-804U ; UTE C80-804:1995-03-01

Electronic components. Guidance document. Interpretation of "EN 29000". Reliability aspects for electronic components. (specification CECC 00 804)
Edition 1995-03-01

Standards [CURRENT]

FD C80-811

Reliability Methodology for Electronic Systems
Edition 2025-04-09

Standards [CURRENT]

NF C82-103-1 ; NF EN 61926-1:2002-10-01

Design automation - Part 1: standard test language for all systems - Common abbreviated test language for all systems (C/ATLAS)
Edition 2002-10-01

Standards [CURRENT]

NF C82-242 ; NF EN 140402:2018-04-14

Blank detail specification : fixed low power wirewound surface mount (SMD) resistors
Edition 2018-04-14

Standards [CURRENT]

NF C82-242/A1 ; NF EN 140402/A1:2018-04-14

Blank detail specification : fixed low power wirewound surface mount (SMD) resistors
Edition 2018-04-14

Standards [CURRENT]

NF C82-242-801 ; NF EN 140402-801:2015-04-03

Detail specification : Fixed low power wirewound surface mount (SMD) resistors - Rectangular - Stability classes 0,5; 1; 2
Edition 2015-04-03

Standards [CURRENT]

NF C83-153

Harmonized system of quality assessment for electronic components. Sectional specification. Fixed metallized polycarbonate film dielectric D.C. capacitors
Edition 1981-10-01

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