NA 134

VDI/DIN-Commission on Air Pollution Prevention (KRdL) - Standards Committee

DIN EN 1948-3 [CURRENT] references following documents:

Document number Edition Title
EN 1948-1 2006-03 Stationary source emissions - Determination of the mass concentration of PCDDs/PCDFs and dioxin-like PCBs - Part 1: Sampling of PCDDs/PCDFs More 
EN 1948-2 2006-03 Stationary source emissions - Determination of the mass concentration of PCDDs/PCDFs and dioxin-like PCBs - Part 2: Extraction and clean-up of PCDDs/PCDFs More 
VDI 3498 Blatt 1 2002-07 Ambient air measurement - Indoor air measurement - Measurement of polychlorinated dibenzo-p-dioxins and dibenzofurans; Method using large filters More 
VDI 3498 Blatt 2 2002-07 Ambient air measurement - Indoor air measurement - Measurement of polychlorinated dibenzo-p-dioxins and dibenzofurans; Method using small filters More 
VDI 3499 Blatt 1 2003-07 Emission measurement - Determination of polychlorinated dibenzo-p-dioxins (PCDDs) and dibenzofurans (PCDFs) - Dilution method; Example of application of DIN EN 1948 for the concentration range < 0,1 ng I-TEQ/m³ and supplement to DIN EN 1948 for the concentration range > 0,1 ng I-TEQ/m³; Determination in filter dust, ash and slag More 
VDI 3499 Blatt 2 2004-02 Emission measurement - Determination of polychlorinated dibenzo-p-dioxins (PCDDs) and dibenzofurans (PCDFs) - Filter/condenser method; Example of application of DIN EN 1948 for the concentration range < 0,1 ng I-TEQ/m³ and supplement to DIN EN 1948 for the concentration range > 0,1 ng I-TEQ/m³ More 
VDI 3499 Blatt 3 2004-02 Emission measurement - Determination of polychlorinated dibenzo-p-dioxins (PCDDs) and dibenzofurans (PCDFs) - Cooled probe method; Example of application of DIN EN 1948 for the concentration range < 0,1 ng I-TEQ/m³ and supplement to DIN EN 1948 for the concentration range > 0,1 ng I-TEQ/m³ More 
XP X43-331 1996-05-01 Air quality. Stationary source emissions. Determination of the confidence interval of a measurement method in the absence of a reference sample by simultaneous parallel measurements More