Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004 + A1:2009 + A2:2017); German version EN 60747-16-4:2004 + A1:2011 + A2:2017
Edition 2018-04

Fibre optic communication subsystem test procedures - Part 2-1: Digital systems - Receiver sensitivity and overload measurement (IEC 61280-2-1:2010); German version EN 61280-2-1:2010
Edition 2011-01

Tests for thermal and weathering properties of aggregates - Part 6: Determination of resistance to freezing and thawing in the presence of salt (NaCl); German version EN 1367-6:2008
Edition 2008-12

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012
Edition 2012-08

Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
Edition 1992-04

Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (IEC 47E/768/CD:2021); Text in German and English
Edition 2022-06

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2017); German version EN 60679-1:2017
Edition 2018-04

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017); German version EN 62884-1:2017
Edition 2018-02

Space engineering - Multipactor, design and test; English version EN 16603-20-01:2020
Edition 2020-11

AC and/or DC-supplied electronic controlgear for discharge lamps (excluding fluorescent lamps) - Performance requirements for low frequency squarewave operation (IEC 62811:2015); German version EN 62811:2015
Edition 2016-03