DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI) (IEC 47A/1019/CD:2017)
Abstract
The objective of this part of DIN EN 62433 (VDE 0847-33) standard is to provide a flow for deriving a macro-model to allow the simulation of the conducted transient immunity of an Integrated Circuit (IC) to pulses such as Electrostatic Discharge (ESD) and Electric Fast Transient (EFT).
Begin
2017-08-16
Planned document number
DIN EN 62433-6
Project number
02227775
Responsible national committee
DKE/K 631 - Halbleiterbauelemente
draft standard
EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI) (IEC 47A/1019/CD:2017)
2017-11
Order from DIN Media
