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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Draft standard [Withdrawn]

DIN IEC 60749-26
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge sensitivity testing - Human body model (HBM) - Component Level (IEC 47/2101A/CDV:2011)

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 26: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Human Body Model (HBM) - Bauelementeniveau (IEC 47/2101A/CDV:2011)

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Edition 2011-09

Original language German , English

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Table of contents

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Elena Rongen

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge sensitivity testing - Human body model (HBM) - Component Level (IEC 47/2101A/CDV:2011)

Responsible national committee

Elena Rongen

DIN IEC 60749-26
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge sensitivity testing - Human body model (HBM) - Component Level (IEC 47/2101A/CDV:2011)